Design & Evaluation Methodology For Built-In-Test
نویسندگان
چکیده
منابع مشابه
Aging Monitoring Methodology for Built-In Self-Test Applications
The high integration level, complexity and performance achieved in new nanometer technologies make IC (Integrated Circuits) products very difficult to test. Moreover, long-term operation brings aging cumulative degradations, and new processes and materials lead to emerging defect phenomena. The consequence is obtaining products with increased variability in their behavior, more susceptible to d...
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ژورنال
عنوان ژورنال: IEEE Transactions on Reliability
سال: 1981
ISSN: 0018-9529
DOI: 10.1109/tr.1981.5221059